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9JWA

Crystal Structure of Lon Bound to a Substrate.

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsPHOTON FACTORY BEAMLINE BL-1A
Synchrotron sitePhoton Factory
BeamlineBL-1A
Temperature [K]80
Detector technologyPIXEL
Collection date2024-05-07
DetectorDECTRIS EIGER X 4M
Wavelength(s)1
Spacegroup nameP 43
Unit cell lengths81.050, 81.050, 104.569
Unit cell angles90.00, 90.00, 90.00
Refinement procedure
Resolution28.670 - 2.290
R-factor0.201
Rwork0.198
R-free0.24900
Structure solution methodMOLECULAR REPLACEMENT
RMSD bond length0.011
RMSD bond angle2.140
Data reduction softwareXDS
Data scaling softwareXDS
Phasing softwarePHENIX
Refinement softwareREFMAC (5.8.0425)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]28.6562.360
High resolution limit [Å]2.2802.290
Number of reflections306168901
<I/σ(I)>12.51
Completeness [%]94.8
Redundancy1.8
CC(1/2)0.9900.860
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, HANGING DROP2951ul of 22mg/ml protein complex, 1ul of 0.1M sodium citrate (pH5.0), 20% PEG 2000 (mother), 0.2ul of 30% D(+)-Glucose monohydrate

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