9GR6
PsiM in complex with SAH, high resolution
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ESRF BEAMLINE ID23-2 |
| Synchrotron site | ESRF |
| Beamline | ID23-2 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-06-27 |
| Detector | DECTRIS EIGER2 X CdTe 9M |
| Wavelength(s) | 0.7293 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 49.895, 78.575, 84.013 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 15.920 - 0.930 |
| R-factor | 0.1464 |
| Rwork | 0.146 |
| R-free | 0.16040 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.016 |
| RMSD bond angle | 1.449 |
| Data reduction software | xia2 |
| Data scaling software | DIALS |
| Phasing software | PHENIX (1.20.1_4487) |
| Refinement software | PHENIX (1.20.1_4487) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 15.920 | 0.963 |
| High resolution limit [Å] | 0.930 | 0.930 |
| Rmerge | 0.086 | |
| Rmeas | 0.090 | |
| Rpim | 0.024 | |
| Number of reflections | 221045 | 21902 |
| <I/σ(I)> | 12.3 | 0.57 |
| Completeness [%] | 99.9 | 99.95 |
| Redundancy | 13.4 | 13.5 |
| CC(1/2) | 0.998 | 0.448 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 8.5 | 277 | 20% PEG 8000, 200 mM MgCl2, 36 mM AMP, 100 mM Tris pH 8.5 |






