Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X10SA |
| Synchrotron site | SLS |
| Beamline | X10SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2020-02-06 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.999891 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 63.667, 85.075, 101.324 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 53.910 - 2.060 |
| R-factor | 0.2166 |
| Rwork | 0.214 |
| R-free | 0.26410 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.003 |
| RMSD bond angle | 0.559 |
| Data reduction software | XDS |
| Data scaling software | Aimless |
| Phasing software | MOLREP |
| Refinement software | PHENIX (1.21.1_5286) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 65.200 | 2.230 |
| High resolution limit [Å] | 2.060 | 2.060 |
| Number of reflections | 24878 | 1245 |
| <I/σ(I)> | 13.2 | |
| Completeness [%] | 95.0 | |
| Redundancy | 13.2 | |
| CC(1/2) | 0.990 | 0.690 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 0.1 M Bis-tris propane pH 8.0, 30 % PEG 3350, 0.2 M So-dium bromide |
