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9GA0

XPA crystal grown in HEK293 cell

This is a non-PDB format compatible entry.
Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsSOLEIL BEAMLINE PROXIMA 1
Synchrotron siteSOLEIL
BeamlinePROXIMA 1
Temperature [K]100
Detector technologyPIXEL
Collection date2022-03-23
DetectorDECTRIS EIGER X 16M
Wavelength(s)0.978565
Spacegroup nameP 21 21 2
Unit cell lengths50.003, 84.322, 118.348
Unit cell angles90.00, 90.00, 90.00
Refinement procedure
Resolution19.860 - 1.590
R-factor0.2006
Rwork0.199
R-free0.23500
Structure solution methodMOLECULAR REPLACEMENT
RMSD bond length0.010
RMSD bond angle1.040
Data reduction softwareautoPROC
Data scaling softwareautoPROC
Phasing softwareMOLREP
Refinement softwareBUSTER (2.10.4)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]19.8581.781
High resolution limit [Å]1.6101.610
Rmerge0.2611.800
Number of reflections449672248
<I/σ(I)>1.83
Completeness [%]94.2
Redundancy13.7
CC(1/2)0.9970.690
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1IN CELL293over-expressed protein in cell

240971

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