9FXT
L2A5 Fab in complex with STn-Ser
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | DIAMOND BEAMLINE I24 |
| Synchrotron site | Diamond |
| Beamline | I24 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-10-19 |
| Detector | DECTRIS EIGER X 9M |
| Wavelength(s) | 0.67019 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 48.355, 125.277, 190.759 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 47.690 - 2.300 |
| R-factor | 0.2635 |
| Rwork | 0.261 |
| R-free | 0.31210 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.002 |
| RMSD bond angle | 0.652 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | PHASER |
| Refinement software | PHENIX ((1.21rc1_5109: ???)) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 47.690 | 6.830 | 2.440 |
| High resolution limit [Å] | 2.300 | 4.860 | 2.300 |
| Rmerge | 0.166 | ||
| Rmeas | 0.170 | 0.062 | 1.300 |
| Number of reflections | 52514 | 3137 | 5942 |
| <I/σ(I)> | 15.6 | ||
| Completeness [%] | 99.9 | ||
| Redundancy | 23.27 | ||
| CC(1/2) | 0.998 | 0.993 | 0.300 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 291 | 22% PEG 3350, 0.1M NH4Cl pH7 |






