Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2021-06-25 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 0.999999 |
Spacegroup name | P 3 2 1 |
Unit cell lengths | 59.290, 59.290, 74.295 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 51.347 - 1.800 |
R-factor | 0.1686 |
Rwork | 0.167 |
R-free | 0.19700 |
Structure solution method | MOLECULAR REPLACEMENT |
Data reduction software | XDS |
Data scaling software | Aimless |
Phasing software | PHASER |
Refinement software | PHENIX (1.13_2998) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 51.350 | 1.864 |
High resolution limit [Å] | 1.800 | 1.800 |
Rmerge | 0.349 | 1.511 |
Rpim | 0.080 | 0.354 |
Number of reflections | 14473 | 1428 |
<I/σ(I)> | 15.9 | 1 |
Completeness [%] | 99.8 | 99.9 |
Redundancy | 19.1 | 18.8 |
CC(1/2) | 0.971 | 0.630 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 293 | 0.15M KCl, 0.1M Hepes7.6, 14% PEG5000MME |