9DT5
Crystal structure of the engineered sulfonylurea repressor CsR (L4.2-20), bound to chlorsulfuron
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 31-ID |
| Synchrotron site | APS |
| Beamline | 31-ID |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2011-03-11 |
| Detector | MAR CCD 165 mm |
| Wavelength(s) | 1 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 63.014, 109.089, 129.145 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 19.983 - 2.000 |
| Rwork | 0.178 |
| R-free | 0.22800 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.007 |
| RMSD bond angle | 1.695 |
| Data reduction software | MOSFLM |
| Data scaling software | SCALA |
| Phasing software | PHASER |
| Refinement software | REFMAC (5.8.0425) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 19.983 | 2.051 |
| High resolution limit [Å] | 2.000 | 2.000 |
| Number of reflections | 60720 | 4206 |
| <I/σ(I)> | 12.8 | |
| Completeness [%] | 99.7 | |
| Redundancy | 10.7 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 295 | 0.05 M Ammonium sulfate 0.05 M BIS-TRIS pH 6.5 30% w/v Polyethylene glycol 600 |
