Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06SA |
Synchrotron site | SLS |
Beamline | X06SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2023-09-11 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 1.0001 |
Spacegroup name | P 2 2 21 |
Unit cell lengths | 58.084, 78.987, 124.979 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 25.980 - 1.784 |
R-factor | 0.2171 |
Rwork | 0.216 |
R-free | 0.24660 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.009 |
RMSD bond angle | 0.970 |
Data reduction software | autoPROC |
Data scaling software | autoPROC |
Phasing software | DIMPLE |
Refinement software | BUSTER (2.11.8 (22-FEB-2023)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 78.987 | 1.898 |
High resolution limit [Å] | 1.784 | 1.784 |
Rmerge | 0.061 | 0.857 |
Rmeas | 0.068 | 1.000 |
Rpim | 0.030 | 0.505 |
Number of reflections | 45901 | 2295 |
<I/σ(I)> | 12.4 | 1.4 |
Completeness [%] | 82.6 | 24.7 |
Redundancy | 5 | 3.7 |
CC(1/2) | 0.999 | 0.511 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 291 | 2.5% w/v TBPB, 0.2 M sodium formate, 20% PEG3350 |