9CMV
Crystal structure of the KRAS-p110alpha complex in the presence of molecular glue D223
This is a non-PDB format compatible entry.
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 24-ID-E |
| Synchrotron site | APS |
| Beamline | 24-ID-E |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-11-17 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.97918 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 58.478, 127.340, 190.798 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 56.900 - 3.010 |
| R-factor | 0.234 |
| Rwork | 0.231 |
| R-free | 0.26750 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.002 |
| RMSD bond angle | 0.394 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | PHASER |
| Refinement software | PHENIX ((1.21.1_5286: ???)) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 56.900 | 56.900 | 3.190 |
| High resolution limit [Å] | 3.010 | 8.970 | 3.010 |
| Rmerge | 0.112 | 0.033 | 1.045 |
| Number of reflections | 28580 | 1165 | 4580 |
| <I/σ(I)> | 11.2 | 36.5 | 1.51 |
| Completeness [%] | 98.1 | 94.2 | 98.7 |
| Redundancy | 4.5 | 4 | 4.5 |
| CC(1/2) | 0.996 | 0.998 | 0.710 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 8 | 293 | 0.1 M Tris, 0.1 M NaCl, 10 % PEG 20K |






