9ARC
Crystal Structure of C0362 (TDE_0362 [TDE0362] resi 205-647)
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 23-ID-B |
Synchrotron site | APS |
Beamline | 23-ID-B |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2020-06-20 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 1.0332 |
Spacegroup name | P 2 21 21 |
Unit cell lengths | 41.598, 99.258, 121.310 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 39.350 - 1.770 |
R-factor | 0.1994 |
Rwork | 0.198 |
R-free | 0.22690 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.007 |
RMSD bond angle | 0.929 |
Data reduction software | cctbx.xfel |
Data scaling software | Aimless (0.7.7) |
Phasing software | PHASER (2.8.3) |
Refinement software | PHENIX (1.20.1_4487) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 39.350 | 1.833 |
High resolution limit [Å] | 1.770 | 1.770 |
Rmerge | 0.049 | 0.828 |
Rmeas | 0.052 | 0.886 |
Rpim | 0.018 | 0.311 |
Number of reflections | 49945 | 4929 |
<I/σ(I)> | 18.32 | 1.77 |
Completeness [%] | 99.9 | 99.88 |
Redundancy | 8.4 | 7.9 |
CC(1/2) | 0.999 | 0.894 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 8 | 296 | 20% PEG 20K, 0.1 M Tris, pH 8.0, 100 mM KBr |