9U3O
Crystal structure of Chi430 mutant E176A in the substrate complex
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL10U2 |
| Synchrotron site | SSRF |
| Beamline | BL10U2 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2025-01-03 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.97918 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 121.676, 49.858, 92.602 |
| Unit cell angles | 90.00, 125.62, 90.00 |
Refinement procedure
| Resolution | 49.510 - 1.350 |
| R-factor | 0.18514 |
| Rwork | 0.184 |
| R-free | 0.20328 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.012 |
| RMSD bond angle | 1.959 |
| Data reduction software | DIALS |
| Data scaling software | Aimless |
| Phasing software | PHENIX |
| Refinement software | REFMAC (5.8.0430) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 60.580 | 1.390 |
| High resolution limit [Å] | 1.350 | 1.350 |
| Number of reflections | 98938 | 7195 |
| <I/σ(I)> | 7.4 | 2.5 |
| Completeness [%] | 99.8 | |
| Redundancy | 6 | 4.4 |
| CC(1/2) | 0.974 | 0.189 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 4.5 | 290 | 0.1 M BIS-TRIS pH 5.5, 2.0 M Ammonium sulfate |






