9O6N
Structure of Siglec-10
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALS BEAMLINE 5.0.1 |
| Synchrotron site | ALS |
| Beamline | 5.0.1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-12-14 |
| Detector | DECTRIS PILATUS 2M |
| Wavelength(s) | 0.97741 |
| Spacegroup name | P 65 2 2 |
| Unit cell lengths | 83.830, 83.830, 484.400 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 46.500 - 2.980 |
| R-factor | 0.2166 |
| Rwork | 0.212 |
| R-free | 0.25880 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.222 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | PHENIX ((1.21.1_5286: ???)) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 48.440 | 48.440 | 3.060 |
| High resolution limit [Å] | 2.980 | 13.330 | 2.980 |
| Rmerge | 0.271 | 0.051 | 1.830 |
| Rmeas | 0.279 | 0.053 | 1.883 |
| Number of reflections | 21921 | 324 | 1560 |
| <I/σ(I)> | 10.84 | ||
| Completeness [%] | 99.9 | ||
| Redundancy | 18.3 | ||
| CC(1/2) | 0.997 | 0.999 | 0.696 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 293.15 | 0.085 M Sodium Citrate pH 5.4, 0.17 M Ammonium Acetate, 15% v/v Glycerol, and 23% w/v PEG 4000 |






