9NV2
Crystal structure of NP207 TCR in complex with NP366-H-2Db
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSLS-II BEAMLINE 19-ID |
| Synchrotron site | NSLS-II |
| Beamline | 19-ID |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2024-08-05 |
| Detector | DECTRIS EIGER2 XE 9M |
| Wavelength(s) | 0.9786 |
| Spacegroup name | P 1 |
| Unit cell lengths | 57.533, 68.016, 74.683 |
| Unit cell angles | 72.83, 89.36, 67.21 |
Refinement procedure
| Resolution | 44.870 - 1.950 |
| R-factor | 0.1956 |
| Rwork | 0.194 |
| R-free | 0.22780 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.008 |
| RMSD bond angle | 0.907 |
| Data reduction software | HKL-3000 |
| Data scaling software | HKL-3000 |
| Phasing software | HKL-3000 |
| Refinement software | PHENIX (1.21.2_5419) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 45.000 | 1.980 |
| High resolution limit [Å] | 1.950 | 1.950 |
| Rmerge | 0.052 | 0.669 |
| Rmeas | 0.066 | 0.872 |
| Rpim | 0.041 | 0.553 |
| Number of reflections | 68675 | 2903 |
| <I/σ(I)> | 17.5 | |
| Completeness [%] | 95.0 | 80.3 |
| Redundancy | 2.3 | 2.1 |
| CC(1/2) | 0.994 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 6.5 | 289 | 0.6 M Sodium Chloride, 0.1 M MES:NaOH, 20% (w/v) PEG 4,000 |
