9FX5
Crystal structure of Cryo2RT Thaumatin at 296K
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X10SA |
| Synchrotron site | SLS |
| Beamline | X10SA |
| Temperature [K] | 296 |
| Detector technology | PIXEL |
| Collection date | 2023-09-13 |
| Detector | DECTRIS EIGER2 X 16M |
| Wavelength(s) | 1 |
| Spacegroup name | P 41 21 2 |
| Unit cell lengths | 58.449, 58.449, 151.499 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 46.270 - 1.592 |
| R-factor | 0.1944 |
| Rwork | 0.193 |
| R-free | 0.22120 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | IN HOUSE MODEL |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.040 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | BUSTER (2.10.4) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 46.280 | 1.690 |
| High resolution limit [Å] | 1.590 | 1.590 |
| Rmeas | 0.070 | 2.310 |
| Number of reflections | 36150 | 5700 |
| <I/σ(I)> | 27.46 | 1.15 |
| Completeness [%] | 100.0 | 100 |
| Redundancy | 26.15 | 26.67 |
| CC(1/2) | 1.000 | 0.740 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 1.6M Na. K. Tartrate |
