Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X10SA |
| Synchrotron site | SLS |
| Beamline | X10SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-09-18 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 1.00002 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 82.964, 86.345, 136.907 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 18.590 - 1.845 |
| R-factor | 0.192 |
| Rwork | 0.191 |
| R-free | 0.20450 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.010 |
| Refinement software | BUSTER (2.11.8) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 73.000 | 1.970 |
| High resolution limit [Å] | 1.840 | 1.840 |
| Number of reflections | 73508 | 3675 |
| <I/σ(I)> | 16.1 | |
| Completeness [%] | 96.1 | |
| Redundancy | 12.7 | |
| CC(1/2) | 1.000 | 0.700 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 277.15 | 13% PEG 8000, 0.2 M ammonium sulfate, 0.1 M tri-sodium citrate pH 4.2 |
