9ARC
Crystal Structure of C0362 (TDE_0362 [TDE0362] resi 205-647)
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 23-ID-B |
| Synchrotron site | APS |
| Beamline | 23-ID-B |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2020-06-20 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 1.0332 |
| Spacegroup name | P 2 21 21 |
| Unit cell lengths | 41.598, 99.258, 121.310 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 39.350 - 1.770 |
| R-factor | 0.1994 |
| Rwork | 0.198 |
| R-free | 0.22690 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.007 |
| RMSD bond angle | 0.929 |
| Data reduction software | cctbx.xfel |
| Data scaling software | Aimless (0.7.7) |
| Phasing software | PHASER (2.8.3) |
| Refinement software | PHENIX (1.20.1_4487) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 39.350 | 1.833 |
| High resolution limit [Å] | 1.770 | 1.770 |
| Rmerge | 0.049 | 0.828 |
| Rmeas | 0.052 | 0.886 |
| Rpim | 0.018 | 0.311 |
| Number of reflections | 49945 | 4929 |
| <I/σ(I)> | 18.32 | 1.77 |
| Completeness [%] | 99.9 | 99.88 |
| Redundancy | 8.4 | 7.9 |
| CC(1/2) | 0.999 | 0.894 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 8 | 296 | 20% PEG 20K, 0.1 M Tris, pH 8.0, 100 mM KBr |






