8ZMN
Crystal structure of ANTXR1
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL10U2 |
Synchrotron site | SSRF |
Beamline | BL10U2 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2024-05-15 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 0.97918 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 38.516, 39.224, 102.593 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 36.640 - 2.140 |
R-factor | 0.2126 |
Rwork | 0.210 |
R-free | 0.26320 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.007 |
RMSD bond angle | 0.748 |
Data reduction software | XDS |
Data scaling software | Aimless |
Phasing software | PHASER |
Refinement software | PHENIX (1.20.1_4487) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 36.640 | 2.217 |
High resolution limit [Å] | 2.140 | 2.140 |
Rmerge | 0.154 | 1.007 |
Number of reflections | 7809 | 5973 |
<I/σ(I)> | 9.96 | |
Completeness [%] | 86.0 | 98.38 |
Redundancy | 8.3 | 7 |
CC(1/2) | 0.996 | 0.693 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 6.5 | 293 | 0.2 M Sodium chloride, 0.1 M BIS-TRIS pH 6.5, 28% w/v Polyethylene glycol 3,350 |