8XZY
Structure of a xylanase Xyl-1 M4 mutant E175A
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | NSRRC BEAMLINE TPS 05A |
Synchrotron site | NSRRC |
Beamline | TPS 05A |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2023-09-29 |
Detector | DECTRIS EIGER2 X 9M |
Wavelength(s) | 0.99987 |
Spacegroup name | P 1 21 1 |
Unit cell lengths | 52.231, 137.536, 52.857 |
Unit cell angles | 90.00, 97.66, 90.00 |
Refinement procedure
Resolution | 23.290 - 1.750 |
R-factor | 0.18301 |
Rwork | 0.181 |
R-free | 0.22800 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.011 |
RMSD bond angle | 1.734 |
Data reduction software | DENZO |
Data scaling software | HKL-2000 |
Phasing software | PHASER |
Refinement software | REFMAC (5.8.0238) |
Data quality characteristics
Overall | Inner shell | Outer shell | |
Low resolution limit [Å] | 25.000 | 25.000 | 1.810 |
High resolution limit [Å] | 1.750 | 3.770 | 1.750 |
Rmerge | 0.042 | 0.036 | 0.123 |
Rmeas | 0.050 | 0.044 | 0.140 |
Rpim | 0.026 | 0.025 | 0.065 |
Total number of observations | 266971 | ||
Number of reflections | 70638 | 7095 | 6664 |
<I/σ(I)> | 26 | ||
Completeness [%] | 95.8 | 95.2 | 90.4 |
Redundancy | 3.8 | 3.1 | 4.1 |
CC(1/2) | 0.997 | 0.996 | 0.988 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | EVAPORATION | 6.5 | 295 | 0.2 M sodium formate, 0.1 M Bis-Tris propane 6.5, 20% PEG 3350 |