8XXE
TtCS-intermediate complex
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL10U2 |
| Synchrotron site | SSRF |
| Beamline | BL10U2 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-01-07 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.9792 |
| Spacegroup name | P 43 21 2 |
| Unit cell lengths | 109.910, 109.910, 265.090 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 34.460 - 2.080 |
| R-factor | 0.17326 |
| Rwork | 0.171 |
| R-free | 0.21672 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.008 |
| RMSD bond angle | 1.555 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | PHASER |
| Refinement software | REFMAC (5.8.0411) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 34.460 | 2.130 |
| High resolution limit [Å] | 2.080 | 2.080 |
| Rmerge | 0.181 | 1.313 |
| Rmeas | 0.189 | |
| Rpim | 0.363 | |
| Number of reflections | 98252 | 7160 |
| <I/σ(I)> | 19.3 | |
| Completeness [%] | 100.0 | |
| Redundancy | 25.7 | |
| CC(1/2) | 0.999 | 0.896 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 289.15 | 0.1M BIS-TRIS pH 6.5, 2.4M Ammonium sulfate |






