8XUU
BA.2.86-T356K Spike Trimer in complex with heparan sulfate (Local refinement)
EM specimen
| Vitrification | Yes |
EM Data Collection
| Microscope | FEI TITAN |
| Electron Gun | FIELD EMISSION GUN |
| Accelerating Voltage (kV) | 300 |
| Detector | GATAN K2 SUMMIT (4k x 4k) |
3D Reconstruction
| Method | SINGLE PARTICLE |
| Resolution (Å) | 3.69 |
| CTF correction | PHASE FLIPPING ONLY |
