8TXF
AvrB bound with RIN4 C-NOI motif
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 19-ID |
Synchrotron site | APS |
Beamline | 19-ID |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2022-10-19 |
Detector | DECTRIS PILATUS3 6M |
Wavelength(s) | 0.97918 |
Spacegroup name | P 21 21 2 |
Unit cell lengths | 57.796, 119.903, 46.434 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 36.710 - 1.290 |
R-factor | 0.1663 |
Rwork | 0.166 |
R-free | 0.17990 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.009 |
RMSD bond angle | 0.981 |
Data reduction software | HKL-3000 |
Data scaling software | HKL-3000 |
Phasing software | PHENIX |
Refinement software | PHENIX (1.20.1_4487) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 1.340 |
High resolution limit [Å] | 1.290 | 1.290 |
Rmerge | 0.055 | 0.596 |
Number of reflections | 82030 | 7654 |
<I/σ(I)> | 46.1 | |
Completeness [%] | 99.9 | |
Redundancy | 10.5 | |
CC(1/2) | 0.910 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 293 | 100 mM Tris (pH 7.5~7.8), 27%~32% PEG 550 MME |