8RS1
CTX-M-14 measured via serial crystallography from a kapton HARE-chip (125 micron)
Experimental procedure
| Experimental method | SINGLE WAVELENGTH | 
| Source type | SYNCHROTRON | 
| Source details | PETRA III, EMBL c/o DESY BEAMLINE P14 (MX2) | 
| Synchrotron site | PETRA III, EMBL c/o DESY | 
| Beamline | P14 (MX2) | 
| Temperature [K] | 293 | 
| Detector technology | PIXEL | 
| Collection date | 2023-04-29 | 
| Detector | DECTRIS EIGER X 4M | 
| Wavelength(s) | 0.976 | 
| Spacegroup name | P 32 2 1 | 
| Unit cell lengths | 42.150, 42.150, 234.200 | 
| Unit cell angles | 90.00, 90.00, 120.00 | 
Refinement procedure
| Resolution | 78.070 - 1.630 | 
| R-factor | 0.1662 | 
| Rwork | 0.165 | 
| R-free | 0.19540 | 
| Structure solution method | MOLECULAR REPLACEMENT | 
| RMSD bond length | 0.005 | 
| RMSD bond angle | 0.775 | 
| Data reduction software | CrystFEL (0.10.2) | 
| Data scaling software | CrystFEL (0.10.2) | 
| Phasing software | PHASER (2.8.3) | 
| Refinement software | PHENIX (1.20.1_4487) | 
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 78.070 | 1.680 | 
| High resolution limit [Å] | 1.630 | 1.630 | 
| Number of reflections | 31624 | 2675 | 
| <I/σ(I)> | 5.34 | 0.95 | 
| Completeness [%] | 100.0 | 100 | 
| Redundancy | 212.6 | |
| CC(1/2) | 0.971 | 0.551 | 
Crystallization Conditions
| crystal ID | method | pH | temperature | details | 
| 1 | BATCH MODE | 293 | CTX-M-14 solution (22 mg/ml) was mixed with 45% precipitant solution (40% PEG8000, 200mM lithium sulfate, 100mM sodium acetate, pH 4.5) and with 5% undiluted seed stock in batch crystallization | 






