Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | PETRA III, EMBL c/o DESY BEAMLINE P14 (MX2) |
Synchrotron site | PETRA III, EMBL c/o DESY |
Beamline | P14 (MX2) |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2019-06-27 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 0.9763 |
Spacegroup name | P 1 |
Unit cell lengths | 45.727, 53.611, 100.770 |
Unit cell angles | 90.03, 90.02, 64.79 |
Refinement procedure
Resolution | 27.620 - 1.225 |
Rwork | 0.168 |
R-free | 0.19240 |
Structure solution method | MOLECULAR REPLACEMENT |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | PHASER |
Refinement software | PHENIX (1.19.2_4158) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 27.620 | 1.269 |
High resolution limit [Å] | 1.225 | 1.225 |
Rmerge | 0.061 | 0.378 |
Number of reflections | 245404 | 9517 |
<I/σ(I)> | 16.05 | |
Completeness [%] | 84.0 | |
Redundancy | 6.7 | |
CC(1/2) | 0.999 | 0.886 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 6.5 | 292 | Morpheus Screen I, condition A4 |