8PV9
Structure of DPS determined by cryoEM at 100 keV
EM specimen
| Vitrification | Yes |
EM Data Collection
| Microscope | JEOL 1400/HR + YPS FEG |
| Electron Gun | FIELD EMISSION GUN |
| Accelerating Voltage (kV) | 100 |
| Detector | DECTRIS SINGLA (1k x 1k) |
3D Reconstruction
| Method | SINGLE PARTICLE |
| Resolution (Å) | 2.7 |
| Software | Servalcat |
| Symmetry | T |
| CTF correction | PHASE FLIPPING AND AMPLITUDE CORRECTION |
