8OVN

X-ray structure of the SF-iGluSnFR-S72A

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	SLS BEAMLINE X10SA
Synchrotron site	SLS
Beamline	X10SA
Temperature [K]	100
Detector technology	PIXEL
Collection date	2020-12-16
Detector	DECTRIS EIGER2 X 16M
Wavelength(s)	1.00007
Spacegroup name	P 31 2 1
Unit cell lengths	106.140, 106.140, 108.140
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	46.600 - 2.600
R-factor	0.2022
Rwork	0.200
R-free	0.25280
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.002
RMSD bond angle	0.521
Data reduction software	XDS
Data scaling software	XSCALE
Phasing software	PHASER
Refinement software	PHENIX (1.19.2_4158)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	50.000	2.700
High resolution limit [Å]	2.600	2.600
Rmerge	0.083	0.710
Number of reflections	22091	2344
<I/σ(I)>	19.3	3.2
Completeness [%]	99.9	100
Redundancy	8.4	8.7
CC(1/2)	0.999	0.858

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION		293	1.5 M tri-sodium citrate pH 6.5