8OVN
X-ray structure of the SF-iGluSnFR-S72A
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X10SA |
Synchrotron site | SLS |
Beamline | X10SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2020-12-16 |
Detector | DECTRIS EIGER2 X 16M |
Wavelength(s) | 1.00007 |
Spacegroup name | P 31 2 1 |
Unit cell lengths | 106.140, 106.140, 108.140 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 46.600 - 2.600 |
R-factor | 0.2022 |
Rwork | 0.200 |
R-free | 0.25280 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.002 |
RMSD bond angle | 0.521 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | PHASER |
Refinement software | PHENIX (1.19.2_4158) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.000 | 2.700 |
High resolution limit [Å] | 2.600 | 2.600 |
Rmerge | 0.083 | 0.710 |
Number of reflections | 22091 | 2344 |
<I/σ(I)> | 19.3 | 3.2 |
Completeness [%] | 99.9 | 100 |
Redundancy | 8.4 | 8.7 |
CC(1/2) | 0.999 | 0.858 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 293 | 1.5 M tri-sodium citrate pH 6.5 |