8OOJ
Crystal structure of dCK C4S-S74E mutant in complex with EdC and UDP
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SOLEIL BEAMLINE PROXIMA 1 |
Synchrotron site | SOLEIL |
Beamline | PROXIMA 1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2022-11-17 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 0.9785 |
Spacegroup name | C 2 2 21 |
Unit cell lengths | 137.470, 138.389, 116.825 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 48.760 - 2.100 |
R-factor | 0.2388 |
Rwork | 0.237 |
R-free | 0.27943 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.003 |
RMSD bond angle | 0.905 |
Data reduction software | XDS |
Data scaling software | XDS |
Phasing software | PHASER |
Refinement software | REFMAC (5.8.0411) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 48.760 | 2.220 |
High resolution limit [Å] | 2.100 | 2.100 |
Number of reflections | 65390 | 10404 |
<I/σ(I)> | 9.64 | |
Completeness [%] | 99.8 | |
Redundancy | 14.99 | |
CC(1/2) | 0.999 | 0.683 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 7.5 | 285 | HEPES 70 mM pH 7.5 Sodium citrate 1.1 M |