8OMD
Crystal structure of mKHK in complex with compound-4
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X10SA |
Synchrotron site | SLS |
Beamline | X10SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2016-03-16 |
Detector | DECTRIS PILATUS 6M-F |
Wavelength(s) | 1 |
Spacegroup name | P 1 |
Unit cell lengths | 47.420, 55.604, 136.632 |
Unit cell angles | 91.40, 93.10, 115.34 |
Refinement procedure
Resolution | 47.920 - 2.000 |
R-factor | 0.237 |
Rwork | 0.235 |
R-free | 0.26600 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.009 |
RMSD bond angle | 1.070 |
Data reduction software | XDS |
Data scaling software | Aimless |
Phasing software | BALBES |
Refinement software | BUSTER |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 47.920 | 2.020 |
High resolution limit [Å] | 2.000 | 2.000 |
Rmerge | 0.155 | 0.721 |
Number of reflections | 80891 | 1618 |
<I/σ(I)> | 4.8 | |
Completeness [%] | 95.7 | |
Redundancy | 3.3 | |
CC(1/2) | 0.992 | 0.707 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION | 277 | 36 % MPD, 7.5 % PEG 8000, 0.1 M MES pH 5.7 |