8HFV
Crystal structure of CTSL in complex with K777
Experimental procedure
| Experimental method | SINGLE WAVELENGTH | 
| Source type | SYNCHROTRON | 
| Source details | SSRF BEAMLINE BL19U1 | 
| Synchrotron site | SSRF | 
| Beamline | BL19U1 | 
| Temperature [K] | 100 | 
| Detector technology | PIXEL | 
| Collection date | 2022-09-01 | 
| Detector | DECTRIS PILATUS 6M | 
| Wavelength(s) | 0.9785 | 
| Spacegroup name | C 1 2 1 | 
| Unit cell lengths | 163.150, 38.300, 147.389 | 
| Unit cell angles | 90.00, 103.97, 90.00 | 
Refinement procedure
| Resolution | 47.680 - 2.100 | 
| R-factor | 0.1984 | 
| Rwork | 0.197 | 
| R-free | 0.24200 | 
| Structure solution method | MOLECULAR REPLACEMENT | 
| Starting model (for MR) | 5maj | 
| RMSD bond length | 0.007 | 
| RMSD bond angle | 0.839 | 
| Data reduction software | XDS (2020-12-02) | 
| Data scaling software | XDS (2020-12-02) | 
| Phasing software | PHENIX (1.20.1-4487-000) | 
| Refinement software | PHENIX (1.20.1-4487-000) | 
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 47.680 | 47.680 | 2.220 | 
| High resolution limit [Å] | 2.100 | 6.240 | 2.100 | 
| Rmerge | 0.189 | 0.066 | 0.758 | 
| Rmeas | 0.210 | 0.074 | 0.844 | 
| Number of reflections | 52170 | 2124 | 8216 | 
| <I/σ(I)> | 7.47 | ||
| Completeness [%] | 98.5 | ||
| Redundancy | 5.21 | ||
| CC(1/2) | 0.990 | 0.997 | 0.696 | 
Crystallization Conditions
| crystal ID | method | pH | temperature | details | 
| 1 | VAPOR DIFFUSION, HANGING DROP | 293 | 9% (v/v) 2-propanol, 90mM Sodium cacodylate/ Hydrochloric acid pH 6.5, 180mM Zinc acetate, 0.5% w/v n-dodecyl-N,N-dimethylamine-N-oxide | 











