8G8K
Crystal structure of Rv1916 (residues 233-398)
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | AUSTRALIAN SYNCHROTRON BEAMLINE MX2 |
Synchrotron site | Australian Synchrotron |
Beamline | MX2 |
Temperature [K] | 85 |
Detector technology | PIXEL |
Collection date | 2018-08-01 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 0.953724 |
Spacegroup name | P 41 21 2 |
Unit cell lengths | 86.046, 86.046, 73.586 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 46.890 - 1.540 |
Rwork | 0.170 |
R-free | 0.19000 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.012 |
RMSD bond angle | 1.776 |
Data reduction software | XDS |
Data scaling software | Aimless |
Phasing software | PHASER |
Refinement software | REFMAC (5.8.0403) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 46.890 | 1.570 |
High resolution limit [Å] | 1.540 | 1.540 |
Number of reflections | 41501 | 2033 |
<I/σ(I)> | 12 | |
Completeness [%] | 100.0 | 99.9 |
Redundancy | 26.6 | |
CC(1/2) | 0.999 | 0.500 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 291 | 20% (w/v) PEG3350, 0.2 M potassium thiocyanate, 0.1 M Bis-Tris propane pH 7.5 |