8G84
Crystal structures of HSD17B13 complexes
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 17-ID |
Synchrotron site | APS |
Beamline | 17-ID |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2019-10-23 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 1.0 |
Spacegroup name | P 21 21 2 |
Unit cell lengths | 76.379, 187.205, 65.365 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 24.160 - 2.467 |
R-factor | 0.2011 |
Rwork | 0.200 |
R-free | 0.22740 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.007 |
RMSD bond angle | 0.890 |
Data reduction software | XDS |
Data scaling software | autoPROC |
Phasing software | PHASER |
Refinement software | BUSTER (2.11.8 (8-JUN-2022)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 93.600 | 2.640 |
High resolution limit [Å] | 2.467 | 2.467 |
Rpim | 0.077 | 0.579 |
Number of reflections | 29109 | 1456 |
<I/σ(I)> | 8.3 | |
Completeness [%] | 93.7 | 50.6 |
Redundancy | 6.6 | 6.8 |
CC(1/2) | 0.996 | 0.581 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 293 | 30% PEG3350, 0.2 M ammonium chloride |