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8F4I

RT XFEL structure of Photosystem II 2000 microseconds after the third illumination at 2.00 Angstrom resolution

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeFREE ELECTRON LASER
Source detailsSACLA BEAMLINE BL2
Synchrotron siteSACLA
BeamlineBL2
Temperature [K]298
Detector technologyCCD
Collection date2019-07-13
DetectorRAYONIX MX300-HS
Wavelength(s)1.241
Spacegroup nameP 21 21 21
Unit cell lengths117.310, 222.595, 308.896
Unit cell angles90.00, 90.00, 90.00
Refinement procedure
Resolution19.720 - 2.000
R-factor0.1863
Rwork0.186
R-free0.23240
Structure solution methodMOLECULAR REPLACEMENT
Starting model (for MR)7rf1
RMSD bond length0.009
RMSD bond angle1.152
Data reduction softwarecctbx.xfel
Data scaling softwarecctbx.xfel.merge
Phasing softwarePHASER
Refinement softwarePHENIX (1.19.2_4158)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]19.7302.030
High resolution limit [Å]2.0002.000
Number of reflections54313026979
<I/σ(I)>4.720.51
Completeness [%]99.9
Redundancy170.123.7
CC(1/2)0.9930.090
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1BATCH MODE6.52980.1 M MES pH 6.5, 0.1 M NH4Cl, 35% (w/v) PEG 5000

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