8F4I
RT XFEL structure of Photosystem II 2000 microseconds after the third illumination at 2.00 Angstrom resolution
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | FREE ELECTRON LASER |
Source details | SACLA BEAMLINE BL2 |
Synchrotron site | SACLA |
Beamline | BL2 |
Temperature [K] | 298 |
Detector technology | CCD |
Collection date | 2019-07-13 |
Detector | RAYONIX MX300-HS |
Wavelength(s) | 1.241 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 117.310, 222.595, 308.896 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 19.720 - 2.000 |
R-factor | 0.1863 |
Rwork | 0.186 |
R-free | 0.23240 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 7rf1 |
RMSD bond length | 0.009 |
RMSD bond angle | 1.152 |
Data reduction software | cctbx.xfel |
Data scaling software | cctbx.xfel.merge |
Phasing software | PHASER |
Refinement software | PHENIX (1.19.2_4158) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 19.730 | 2.030 |
High resolution limit [Å] | 2.000 | 2.000 |
Number of reflections | 543130 | 26979 |
<I/σ(I)> | 4.72 | 0.51 |
Completeness [%] | 99.9 | |
Redundancy | 170.1 | 23.7 |
CC(1/2) | 0.993 | 0.090 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | BATCH MODE | 6.5 | 298 | 0.1 M MES pH 6.5, 0.1 M NH4Cl, 35% (w/v) PEG 5000 |