8B3X
High resolution crystal structure of dimeric SUDV VP40
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06SA |
| Synchrotron site | SLS |
| Beamline | X06SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2020-03-20 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 1.000009 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 61.948, 90.589, 48.130 |
| Unit cell angles | 90.00, 93.92, 90.00 |
Refinement procedure
| Resolution | 51.050 - 1.531 |
| R-factor | 0.1902 |
| Rwork | 0.189 |
| R-free | 0.20740 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 4ld8 |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.070 |
| Data reduction software | XDS (Feb 5, 2021) |
| Data scaling software | Aimless (0.7.7) |
| Phasing software | PHASER |
| Refinement software | BUSTER (2.10.4) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 51.054 | 51.054 | 1.558 |
| High resolution limit [Å] | 1.531 | 4.156 | 1.531 |
| Rmerge | 0.028 | 0.021 | 0.259 |
| Rmeas | 0.034 | 0.025 | 0.306 |
| Rpim | 0.018 | 0.013 | 0.162 |
| Total number of observations | 124804 | 6176 | 6376 |
| Number of reflections | 38404 | 1960 | 1870 |
| <I/σ(I)> | 19.58 | 40.35 | 4.47 |
| Completeness [%] | 96.5 | 96.2 | 93.5 |
| Redundancy | 3.25 | 3.15 | 3.41 |
| CC(1/2) | 0.999 | 0.999 | 0.951 |
| Anomalous redundancy | 1.7 | 1.7 | 1.8 |
| CC(ano) | -0.221 | -0.249 | 0.115 |
| |DANO|/σ(DANO) | 0.7 | 0.6 | 0.6 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 293 | 100 mM HEPES 40 mM MgCl2 10% (v/v) PEG400 20% ethylen glycol as cryoprotectant |
