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8B1O

Crystal structure of SUDV VP40 C314S mutant

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsSLS BEAMLINE X06SA
Synchrotron siteSLS
BeamlineX06SA
Temperature [K]100
Detector technologyPIXEL
Collection date2021-04-27
DetectorDECTRIS EIGER X 16M
Wavelength(s)0.999998
Spacegroup nameC 1 2 1
Unit cell lengths64.247, 91.005, 48.433
Unit cell angles90.00, 96.06, 90.00
Refinement procedure
Resolution48.160 - 1.750
R-factor0.1874
Rwork0.186
R-free0.21540
Structure solution methodMOLECULAR REPLACEMENT
Starting model (for MR)4ld8
RMSD bond length0.006
RMSD bond angle0.793
Data reduction softwareXDS
Data scaling softwareAimless
Phasing softwarePHASER
Refinement softwarePHENIX (1.17.1_3660)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]48.1601.740
High resolution limit [Å]1.7001.700
Number of reflections297231486
<I/σ(I)>10.11.9
Completeness [%]98.591.6
Redundancy3.83.2
CC(1/2)0.9940.803
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, SITTING DROP293Morpheus A7 30% (w/v) GOL_P4K (glycerol and PEG4000) 0.1 M morpheus buffer 2 (HEPES and MOPS) 60 mM morpheus divalents (MgCl2, CaCl2)

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