8A90
Crystal structure of FrsH
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06DA |
| Synchrotron site | SLS |
| Beamline | X06DA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2020-07-06 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.999987 |
| Spacegroup name | P 41 21 2 |
| Unit cell lengths | 117.715, 117.715, 234.261 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 48.020 - 2.574 |
| R-factor | 0.2185 |
| Rwork | 0.217 |
| R-free | 0.26390 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 4jo0 |
| RMSD bond length | 0.004 |
| RMSD bond angle | 0.882 |
| Data reduction software | XDS (1.20_4444) |
| Phasing software | PHENIX (1.20_4444) |
| Refinement software | PHENIX (1.20_4444) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 48.020 | 2.665 |
| High resolution limit [Å] | 2.574 | 2.574 |
| Rmerge | 0.151 | |
| Number of reflections | 87244 | 4482 |
| <I/σ(I)> | 7.22 | 1.01 |
| Completeness [%] | 93.0 | |
| Redundancy | 4.2 | |
| CC(1/2) | 0.991 | 0.458 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 277.15 | 0.10 M HEPES pH 7.8, 10.89% (w/v) PEG 20000, 0.08 M KAc, 1.36% glycerol |






