8XZZ
Structure of a xylanase Xyl-1 M4 E175A in complex with xylobiose
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSRRC BEAMLINE TPS 05A |
| Synchrotron site | NSRRC |
| Beamline | TPS 05A |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-09-25 |
| Detector | DECTRIS EIGER2 X 9M |
| Wavelength(s) | 0.99987 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 52.074, 137.540, 52.848 |
| Unit cell angles | 90.00, 97.83, 90.00 |
Refinement procedure
| Resolution | 24.270 - 1.720 |
| R-factor | 0.1617 |
| Rwork | 0.161 |
| R-free | 0.19170 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 3wp4 |
| RMSD bond length | 0.006 |
| RMSD bond angle | 0.897 |
| Data reduction software | DENZO |
| Data scaling software | HKL-2000 |
| Phasing software | REFMAC |
| Refinement software | PHENIX ((1.17.1_3660: ???)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 24.270 | 1.780 |
| High resolution limit [Å] | 1.720 | 1.720 |
| Rmerge | 0.051 | 0.152 |
| Rmeas | 0.060 | |
| Rpim | 0.031 | |
| Number of reflections | 73843 | 6968 |
| <I/σ(I)> | 21.3 | 13.45 |
| Completeness [%] | 95.5 | 90.6 |
| Redundancy | 3.9 | 4 |
| CC(1/2) | 0.997 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | EVAPORATION | 295 | 0.2 M sodium formate, 0.1 M Bis-Tris propane, pH 6.5, and 20% PEG 3350 |






