8VCN

GluER mutant - W66F F269Y Q293T F68Y T36E P263L

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-2
Synchrotron site	NSLS-II
Beamline	17-ID-2
Temperature [K]	100
Detector technology	PIXEL
Collection date	2023-09-25
Detector	DECTRIS EIGER X 16M
Wavelength(s)	0.9793
Spacegroup name	C 1 2 1
Unit cell lengths	54.887, 90.914, 74.872
Unit cell angles	90.00, 110.13, 90.00

Refinement procedure

Resolution	27.810 - 1.470
R-factor	0.1587
Rwork	0.157
R-free	0.18380
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.005
RMSD bond angle	0.886
Data reduction software	XDS
Data scaling software	Aimless
Phasing software	PHASER
Refinement software	PHENIX (1.17_3644)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	27.810	1.510
High resolution limit [Å]	1.470	1.470
Rmerge	0.112	0.742
Rmeas	0.124	0.831
Rpim	0.054	0.368
Number of reflections	57386	3661
<I/σ(I)>	9	1.7
Completeness [%]	98.9	85.5
Redundancy	5.1	4.8
CC(1/2)	0.997	0.711

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, SITTING DROP	4	293	4% v/v Tacsimate, pH 4.0, and 20% w/v polyethylene glycol 3350