8VCN
GluER mutant - W66F F269Y Q293T F68Y T36E P263L
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSLS-II BEAMLINE 17-ID-2 |
| Synchrotron site | NSLS-II |
| Beamline | 17-ID-2 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-09-25 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.9793 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 54.887, 90.914, 74.872 |
| Unit cell angles | 90.00, 110.13, 90.00 |
Refinement procedure
| Resolution | 27.810 - 1.470 |
| R-factor | 0.1587 |
| Rwork | 0.157 |
| R-free | 0.18380 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.005 |
| RMSD bond angle | 0.886 |
| Data reduction software | XDS |
| Data scaling software | Aimless |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.17_3644) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 27.810 | 1.510 |
| High resolution limit [Å] | 1.470 | 1.470 |
| Rmerge | 0.112 | 0.742 |
| Rmeas | 0.124 | 0.831 |
| Rpim | 0.054 | 0.368 |
| Number of reflections | 57386 | 3661 |
| <I/σ(I)> | 9 | 1.7 |
| Completeness [%] | 98.9 | 85.5 |
| Redundancy | 5.1 | 4.8 |
| CC(1/2) | 0.997 | 0.711 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 4 | 293 | 4% v/v Tacsimate, pH 4.0, and 20% w/v polyethylene glycol 3350 |
