8RSX
TRYPTOPHAN SYNTHASE measured via serial crystallography from a silicon HARE-chip
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | PETRA III, EMBL c/o DESY BEAMLINE P14 (MX2) |
| Synchrotron site | PETRA III, EMBL c/o DESY |
| Beamline | P14 (MX2) |
| Temperature [K] | 293.15 |
| Detector technology | PIXEL |
| Collection date | 2023-06-27 |
| Detector | DECTRIS EIGER X 4M |
| Wavelength(s) | 0.976 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 183.600, 61.500, 67.600 |
| Unit cell angles | 90.00, 94.55, 90.00 |
Refinement procedure
| Resolution | 91.510 - 2.000 |
| R-factor | 0.1813 |
| Rwork | 0.179 |
| R-free | 0.22040 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.007 |
| RMSD bond angle | 0.906 |
| Data reduction software | CrystFEL (0.10.2) |
| Data scaling software | CrystFEL (0.10.2) |
| Phasing software | PHASER (2.8.3) |
| Refinement software | PHENIX ((1.17.1_3660: ???)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 91.510 | 2.070 |
| High resolution limit [Å] | 2.000 | 2.000 |
| Number of reflections | 51012 | 5064 |
| <I/σ(I)> | 3.33 | 1.01 |
| Completeness [%] | 100.0 | 100 |
| Redundancy | 49.8 | |
| CC(1/2) | 0.943 | 0.505 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | BATCH MODE | 7.5 | 293 | PEG 300, Tris-HCl, Cesium chloirde |






