Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06DA |
Synchrotron site | SLS |
Beamline | X06DA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2021-06-18 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 1.000002 |
Spacegroup name | P 21 21 2 |
Unit cell lengths | 44.633, 129.220, 37.670 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 42.190 - 1.560 |
R-factor | 0.1735 |
Rwork | 0.171 |
R-free | 0.22510 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.009 |
RMSD bond angle | 1.122 |
Data reduction software | XDS |
Data scaling software | Aimless |
Phasing software | PHASER |
Refinement software | PHENIX (dev_5246) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 42.190 | 1.640 |
High resolution limit [Å] | 1.560 | 1.560 |
Rmeas | 0.143 | 1.460 |
Number of reflections | 60215 | 9679 |
<I/σ(I)> | 8.67 | 1.31 |
Completeness [%] | 99.8 | 99.7 |
Redundancy | 5.7 | 5.4 |
CC(1/2) | 0.997 | 0.665 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 277 | 0.1M BisTris Propane pH 6.5, 0.2 M NaNO3, 20% w/v PEG3350, 10% ethylene glycol |