8PMZ
HEV gt3 P domain in complex with glycan-insensitive nAb p61.15
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06SA |
| Synchrotron site | SLS |
| Beamline | X06SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2021-03-06 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.99987 |
| Spacegroup name | P 21 21 2 |
| Unit cell lengths | 108.590, 178.770, 49.660 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 47.850 - 1.912 |
| R-factor | 0.2262 |
| Rwork | 0.225 |
| R-free | 0.25650 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.008 |
| RMSD bond angle | 0.980 |
| Data reduction software | XDS |
| Data scaling software | pointless |
| Phasing software | PHASER |
| Refinement software | BUSTER (2.10.4) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 47.850 | 1.980 |
| High resolution limit [Å] | 1.912 | 1.912 |
| Rmeas | 0.176 | |
| Number of reflections | 74611 | 5776 |
| <I/σ(I)> | 11.23 | |
| Completeness [%] | 97.1 | |
| Redundancy | 13.52 | |
| CC(1/2) | 0.997 | 0.906 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 8.5 | 293 | 20% w/v PEG 3350, 0.1M Bis-Tris propane pH 8.5 and 0.2M Potassium thiocyanate |
