8IVX
Crystal structure of NRP2 in complex with aNRP2-14 Fab fragment
This is a non-PDB format compatible entry.
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL19U1 |
| Synchrotron site | SSRF |
| Beamline | BL19U1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-03-17 |
| Detector | DECTRIS PILATUS3 6M |
| Wavelength(s) | 0.97915 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 89.501, 89.411, 130.877 |
| Unit cell angles | 90.00, 94.18, 90.00 |
Refinement procedure
| Resolution | 46.650 - 1.900 |
| R-factor | 0.19284 |
| Rwork | 0.191 |
| R-free | 0.22547 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.006 |
| RMSD bond angle | 1.057 |
| Data reduction software | HKL-3000 |
| Data scaling software | HKL-3000 |
| Phasing software | PHASER |
| Refinement software | REFMAC (5.8.0352) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 50.000 | 1.930 |
| High resolution limit [Å] | 1.900 | 1.900 |
| Rmerge | 0.074 | 0.590 |
| Rmeas | 0.082 | 0.649 |
| Rpim | 0.033 | 0.264 |
| Number of reflections | 78778 | 3849 |
| <I/σ(I)> | 23.28 | 2.41 |
| Completeness [%] | 97.4 | 96.1 |
| Redundancy | 5.9 | 6.1 |
| CC(1/2) | 0.997 | 0.816 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 4.5 | 289 | 30% PEG300, 0.1M Sodium acetate trihydrate pH 4.5 |
