8HFV
Crystal structure of CTSL in complex with K777
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL19U1 |
| Synchrotron site | SSRF |
| Beamline | BL19U1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2022-09-01 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 0.9785 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 163.150, 38.300, 147.389 |
| Unit cell angles | 90.00, 103.97, 90.00 |
Refinement procedure
| Resolution | 47.680 - 2.100 |
| R-factor | 0.1984 |
| Rwork | 0.197 |
| R-free | 0.24200 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 5maj |
| RMSD bond length | 0.007 |
| RMSD bond angle | 0.839 |
| Data reduction software | XDS (2020-12-02) |
| Data scaling software | XDS (2020-12-02) |
| Phasing software | PHENIX (1.20.1-4487-000) |
| Refinement software | PHENIX (1.20.1-4487-000) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 47.680 | 47.680 | 2.220 |
| High resolution limit [Å] | 2.100 | 6.240 | 2.100 |
| Rmerge | 0.189 | 0.066 | 0.758 |
| Rmeas | 0.210 | 0.074 | 0.844 |
| Number of reflections | 52170 | 2124 | 8216 |
| <I/σ(I)> | 7.47 | ||
| Completeness [%] | 98.5 | ||
| Redundancy | 5.21 | ||
| CC(1/2) | 0.990 | 0.997 | 0.696 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 293 | 9% (v/v) 2-propanol, 90mM Sodium cacodylate/ Hydrochloric acid pH 6.5, 180mM Zinc acetate, 0.5% w/v n-dodecyl-N,N-dimethylamine-N-oxide |






