Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 24-ID-E |
| Synchrotron site | APS |
| Beamline | 24-ID-E |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2017-03-15 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.97918 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 27.898, 44.047, 133.954 |
| Unit cell angles | 90.00, 94.59, 90.00 |
Refinement procedure
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 100.000 | 2.010 |
| High resolution limit [Å] | 1.975 | 1.975 |
| Rmerge | 0.099 | 0.209 |
| Number of reflections | 22984 | 1134 |
| <I/σ(I)> | 13.425 | 9.44 |
| Completeness [%] | 98.0 | 97.4 |
| Redundancy | 4.9 | 4.3 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7.5 | 277 | 0.1 M HEPES pH7.5 0.2 M NaOAc 20% PEG 3000 |






