7RF6

RT XFEL structure of Photosystem II 250 microseconds after the second illumination at 2.01 Angstrom resolution

This is a non-PDB format compatible entry.

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	FREE ELECTRON LASER
Source details	SLAC LCLS BEAMLINE MFX
Synchrotron site	SLAC LCLS
Beamline	MFX
Temperature [K]	298
Detector technology	CCD
Collection date	2018-11-27
Detector	RAYONIX MX340-HS
Wavelength(s)	1.3027
Spacegroup name	P 21 21 21
Unit cell lengths	117.039, 221.917, 308.295
Unit cell angles	90.00, 90.00, 90.00

Refinement procedure

Resolution	33.590 - 2.010
R-factor	0.1807
Rwork	0.180
R-free	0.22700
Structure solution method	MOLECULAR REPLACEMENT
Starting model (for MR)	6dhe
RMSD bond length	0.013
RMSD bond angle	1.427
Data reduction software	cctbx.xfel
Data scaling software	cxi.merge
Phasing software	PHASER
Refinement software	PHENIX (1.19.2_4158)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	33.590	2.034
High resolution limit [Å]	2.010	2.010
Number of reflections	535670	25929
<I/σ(I)>	14.3	0.6
Completeness [%]	99.8	97.34
Redundancy	71.1
CC(1/2)	0.977	0.051

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	BATCH MODE	6.5	298	0.1 M MES pH 6.5, 0.1 M NH4Cl, 35% (w/v) PEG 5000