7ELX
The crystal structure of CTLA-4 and Fab
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL17U |
Synchrotron site | SSRF |
Beamline | BL17U |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2020-09-16 |
Detector | DECTRIS EIGER2 X 16M |
Wavelength(s) | 0.9791 |
Spacegroup name | C 2 2 21 |
Unit cell lengths | 95.923, 196.921, 148.389 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 44.200 - 2.140 |
R-factor | 0.1778 |
Rwork | 0.177 |
R-free | 0.21720 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 6rp8 |
Data reduction software | HKL-2000 |
Data scaling software | HKL-2000 |
Phasing software | PHASER |
Refinement software | PHENIX (1.18.2_3874) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 45.640 | 2.180 |
High resolution limit [Å] | 2.140 | 2.140 |
Rmerge | 0.101 | 0.101 |
Number of reflections | 76857 | |
<I/σ(I)> | 27.12 | |
Completeness [%] | 100.0 | |
Redundancy | 7.8 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 285 | PEG8000 10%, 0.1M Na Citrate 0.1M (NH4)2SO4 |