7XBR
Crystal structure of phosphorylated AtMKK5
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL17U1 |
| Synchrotron site | SSRF |
| Beamline | BL17U1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2018-12-04 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.979 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 83.666, 198.572, 202.824 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 49.130 - 3.200 |
| R-factor | 0.211 |
| Rwork | 0.209 |
| R-free | 0.24560 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 4bf2 |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.670 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | PHASER |
| Refinement software | REFMAC (5.8.0267) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 50.000 | 3.310 |
| High resolution limit [Å] | 3.200 | 3.200 |
| Rmerge | 0.167 | 1.697 |
| Number of reflections | 55113 | 5452 |
| <I/σ(I)> | 15.6 | 1.86 |
| Completeness [%] | 96.7 | 97.2 |
| Redundancy | 7.5 | 7.6 |
| CC(1/2) | 0.990 | 0.872 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 7 | 291 | 0.1 M Bis-Tris Propane (pH 7.0), 2.8 M NaAc (pH 7.0) and 0.4M NaCl |
