7XAY
Crystal structure of Hat1-Hat2-Asf1-H3-H4
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL17U1 |
Synchrotron site | SSRF |
Beamline | BL17U1 |
Temperature [K] | 93 |
Detector technology | PIXEL |
Collection date | 2019-10-18 |
Detector | DECTRIS EIGER X 16M |
Wavelength(s) | 0.9792 |
Spacegroup name | P 21 21 21 |
Unit cell lengths | 96.410, 124.684, 161.066 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 22.400 - 3.300 |
R-factor | 0.2321 |
Rwork | 0.230 |
R-free | 0.25630 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 4psw |
RMSD bond length | 0.003 |
RMSD bond angle | 0.595 |
Data reduction software | XDS |
Data scaling software | Aimless |
Phasing software | PHASER |
Refinement software | PHENIX (1.19.2_4158) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 98.590 | 3.500 |
High resolution limit [Å] | 3.300 | 3.300 |
Number of reflections | 29577 | 4740 |
<I/σ(I)> | 9.4 | 3 |
Completeness [%] | 99.0 | |
Redundancy | 6.6 | |
CC(1/2) | 0.993 | 0.742 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 289 | 100 mM Bis-Tris propane, pH 6.5, 20% PEG-3350, and 200 mM sodium nitrate |