7NWZ
ALK:ALKAL2 complex
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SOLEIL BEAMLINE PROXIMA 2 |
| Synchrotron site | SOLEIL |
| Beamline | PROXIMA 2 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2020-02-01 |
| Detector | DECTRIS EIGER X 9M |
| Wavelength(s) | 0.9800 |
| Spacegroup name | P 43 21 2 |
| Unit cell lengths | 97.910, 97.910, 356.170 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 48.960 - 4.170 |
| R-factor | 0.2561 |
| Rwork | 0.255 |
| R-free | 0.26760 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 7nx4 |
| RMSD bond length | 0.002 |
| RMSD bond angle | 0.482 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | PHASER |
| Refinement software | BUSTER (2.11.2) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 48.960 | 4.320 |
| High resolution limit [Å] | 4.170 | 4.170 |
| Rmeas | 0.206 | 1.680 |
| Number of reflections | 13681 | 942 |
| <I/σ(I)> | 13.9 | |
| Completeness [%] | 93.8 | |
| Redundancy | 25.7 | |
| CC(1/2) | 0.990 | 0.890 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 287 | 0.1M MES pH 6.5 15% w/v PEG 6000 5% w/v MPD |
