7NA3
HDM2 in complex with compound 62
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06SA |
| Synchrotron site | SLS |
| Beamline | X06SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2013-05-01 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 1.00000 |
| Spacegroup name | P 61 2 2 |
| Unit cell lengths | 56.467, 56.467, 105.166 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 49.000 - 2.210 |
| R-factor | 0.1981 |
| Rwork | 0.196 |
| R-free | 0.21910 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.015 |
| RMSD bond angle | 1.438 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | REFMAC |
| Refinement software | REFMAC (5.5.0109) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 49.000 | 2.460 |
| High resolution limit [Å] | 2.210 | 2.210 |
| Rmerge | 0.076 | 0.586 |
| Rmeas | 0.079 | 0.024 |
| Number of reflections | 5379 | 29 |
| <I/σ(I)> | 28.25 | 5.6 |
| Completeness [%] | 99.4 | 99 |
| Redundancy | 15 | 15.7 |
| CC(1/2) | 1.000 | 0.999 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 293 | undisclosed |






