7MEK
Structure of copper bound to Ycnl
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 21-ID-D |
| Synchrotron site | APS |
| Beamline | 21-ID-D |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-12-13 |
| Detector | DECTRIS EIGER X 9M |
| Wavelength(s) | 1.3776 |
| Spacegroup name | P 63 2 2 |
| Unit cell lengths | 90.190, 90.190, 209.120 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 29.520 - 2.110 |
| R-factor | 0.1968 |
| Rwork | 0.195 |
| R-free | 0.21750 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 3esm |
| RMSD bond length | 0.002 |
| RMSD bond angle | 0.526 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | PHENIX |
| Refinement software | PHENIX (1.19.2_4158) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 30.000 | 2.160 |
| High resolution limit [Å] | 2.110 | 2.110 |
| Rmeas | 0.138 | |
| Number of reflections | 54321 | 3960 |
| <I/σ(I)> | 9.64 | 2.64 |
| Completeness [%] | 99.6 | 98 |
| Redundancy | 5.3 | |
| CC(1/2) | 0.995 | 0.569 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 0.1M citric acid, 2.17 M ammonium sulfate |






