7L26
HPK1 IN COMPLEX WITH COMPOUND 38
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X10SA |
| Synchrotron site | SLS |
| Beamline | X10SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-05-03 |
| Detector | DECTRIS PILATUS 6M |
| Wavelength(s) | 1.00002 |
| Spacegroup name | P 1 |
| Unit cell lengths | 58.138, 58.168, 98.955 |
| Unit cell angles | 89.84, 90.13, 97.60 |
Refinement procedure
| Resolution | 98.950 - 2.300 |
| R-factor | 0.2627 |
| Rwork | 0.262 |
| R-free | 0.29830 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | PREVIOUSLY SOLVED STUCTURE |
| RMSD bond length | 0.013 |
| RMSD bond angle | 1.666 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Refinement software | REFMAC (5.8.0155) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 98.950 | 2.550 |
| High resolution limit [Å] | 2.300 | 2.300 |
| Rmeas | 0.092 | 0.568 |
| Number of reflections | 54548 | 14634 |
| <I/σ(I)> | 8.65 | 2.56 |
| Completeness [%] | 95.0 | 95.4 |
| Redundancy | 2.2 | 2.2 |
| CC(1/2) | 0.997 | 0.998 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 293 | UNDISCLOSED |






